接触面原位光学观测方法的初步研究  

Preliminary Study of In-situ Observation Method for Contact Interface

作　　者：任万滨[1] 常成[1] 郎秋生 陈宇[1] 薛升俊[1] 

机构地区：[1]哈尔滨工业大学电气工程及自动化学院,哈尔滨150001

出　　处：《电工材料》2015年第5期35-38,共4页Electrical Engineering Materials

基　　金：国家自然科学基金项目(51007010和51377029)

摘　　要：本文提出了一种对接触面原位光学观测方法和装置,该装置可通过连续变焦显微镜头和CMOS相机观察试样与蓝宝石平面接触形成的接触面,可实现上位机对接触面图像的保存和处理,从而获得接触面视在接触面积和实际接触面积。通过对2 mm和5 mm直径的钢球与蓝宝石平板接触面进行试验研究,得到了其视在接触面积和实际接触面积随接触压力的变化曲线。An observation method and system for contact interface are developed in order to investi- gate the contact area under normal force. With the use of the zoom microscopic lens and CMOS industrial camera, the contact area between sample and sapphire plate could be observed. Images of the contact interface could be saved in the computer, and then the apparent contact area and real contact area are calculated by the image processing program. In this work, the contact interfaces between steel ball （with two different diameters of 2 turn and 5 nun） and sapphire plate were experimentally studied and the curves of apparent contact area and real contact area vs. contact force were obtained.

关 键 词：接触面积 接触力 图像处理 实时观测 

分 类 号：TH742.9[机械工程—光学工程]