SF_6红外成像检漏技术在特高压带电检测中的应用  被引量:17

Application of SF_6 Infrared Imaging Leakage Detection Technology in Live Detection for UHV

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作  者:芦竹茂[1] 梁基重[1] 王天正[1] 俞华[1] 马丽强[1] 

机构地区:[1]国网山西省电力公司电力科学研究院,太原030001

出  处:《绝缘材料》2015年第9期29-33,共5页Insulating Materials

摘  要:介绍了SF6红外成像检漏技术的基本原理和在特高压运维检修中的应用案例,运用SF6红外成像检漏技术在设备不停电的状态下进行SF6气体检漏,并精确定位泄漏点。结果表明:在带电检测过程中,结合SF6气体密度继电器显示的压力变化,采用SF6红外成像检漏能有针对性地对设备进行检测,并提高检测效率。The basic principle of SF6 infrared imaging leakage detection technology and the application cases in UHV substation were introduced. The SF6 gas was tested without interrupting power supply, and the leakage points were located precisely. The results show that the SF6 infrared imaging leakage detec-tion technology could test the equipment targetedly and improve the detection efficiency through combining the change of SF6 gas pressure showed in relay.

关 键 词:SF6气体绝缘 检漏 红外成像 带电检测 特高压 

分 类 号:TM855[电气工程—高电压与绝缘技术]

 

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