微波脉冲频率与重频对限幅器热损伤效应的影响  

Influence of frequency and microwave repetition rate on thermal damage process of PIN limiter

作　　者：赵振国[1,2] 周海京[1,3,2] 马弘舸[4,2] 王艳[4,2] 

机构地区：[1]中物院高性能数值模拟软件中心,北京100088 [2]中国工程物理研究院复杂电磁环境重点实验室,四川绵阳621900 [3]北京应用物理与计算数学研究所,北京100088 [4]中国工程物理研究院应用电子学研究所,四川绵阳621900

出　　处：《强激光与粒子束》2015年第10期195-199,共5页High Power Laser and Particle Beams

基　　金：中国工程物理研究院复杂电磁环境重点实验室基金项目(2015E-01-01)

摘　　要：基于PIN限幅器的电路与器件物理混合模式(Mixed-Mode)模型,考虑大功率微波作用下器件的高温强电场多物理过程,模拟分析了频率及重频等微波脉冲参数对限幅器热损伤过程的影响,数值模拟结果表明,不同频率的微波脉冲损伤PIN限幅器存在"拐点"频率,"拐点"频率的微波脉冲附近需要更多的能量(脉宽)损伤器件;重频脉冲前一个脉冲作用后,器件峰值温度近似负指数关系快速下降,器件处于高温时更容易损伤,热积累效应使重频脉冲较单个脉冲更容易毁伤器件。Based on the PIN limiter circuit/device physics mixed mode model,considering the high electric field and high temperature devices multi-physical features under high-power microwave,we simulate the influence of frequency and microwave pulse repetition rate on thermal damage process of PIN limiter.Numerical simulation results show that different frequency microwave pulses damaging the PIN limiter exist a'turning point'frequency.Microwave pulses near the'turning point'frequency require more energy or pulse width to damage the device.After one pulse function on the device,the peak temperature of the device declines fast and it is similar to negative exponent relationship.It is easier when the device is in a high temperature.Heat accumulation effect makes it easier on damaging PIN limiter than the single pulse microwave.

关 键 词：载波频率 重频 热积累损伤 PIN限幅器 

分 类 号：TN385[电子电信—物理电子学]