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出 处:《原子能科学技术》2015年第10期1888-1892,共5页Atomic Energy Science and Technology
摘 要:通过对244 Cm的α实验谱进行拟合得到单能峰的峰形参数,采用随机抽样技术表征谱计数的统计涨落,建立了一种模拟半导体α能谱的方法。利用该方法模拟238Pu和243Am的α能谱,与实验谱基本吻合,证明了方法的可靠性。在此基础上,研究了239Pu对237Np的α能峰的影响,结果表明,当239Pu与237Np的活度比A(239Pu)/A(237Np)≤10时,通过解谱得到的A(239Pu)/A(237Np)与设定值的相对偏差≤2.0%。对于A(239Pu)/A(237Np)约为3 000的样品,如果对钚的去污系数达到300以上,则可由α能谱法测量样品中的237 Np。The peak shape parameters were obtained by fitting 244Cm α experiment spectra.The fluctuation of counts was characterized by random sampling,and a simulation method ofαspectra was established.The method was verified by comparing the simulation spectra and the experiment spectra of 238 Pu and 243 Am.The effects of 239 Pu on 237 Np were analyzed.The results indicate that the relative deviation between the activity ratio of 239 Pu and 237 Np(A(239 Pu)/A(237 Np))obtained by spectra analysis and the preassigned value is ≤2.0% if the A(239Pu)/A(237 Np)is ≤10.For the sample with A(239Pu)/A(237 Np)of about 3 000,237 Np can be measured withαspectrometry if the decontamination factor of 239 Pu reaches to 300.
分 类 号:TL817.2[核科学技术—核技术及应用]
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