电子电气产品中19种元素的无损测定、分布研究及风险评估  

Rapid-nondestructive determination, distribution research and risk assessment of 19 elements in electronic and electrical products

作　　者：高欢[1] 卫碧文[1] 倪旎[1] 望秀丽 

机构地区：[1]上海出入境检验检疫局,上海200135

出　　处：《分析试验室》2015年第11期1295-1299,共5页Chinese Journal of Analysis Laboratory

基　　金：上海出入境检验检疫局项目(HK023-2015)资助

摘　　要：采用X射线荧光光谱法快速无损扫描测定电子电气产品中19种元素,考察了特征X射线以及计数时间的选择,并通过自制标准块绘制标准曲线。同时利用MAPPING功能进行微区原位扫描,掌握19种元素的分布情况及分布特征。并利用换算因子计算REACH高关注物质的含量,对19种元素进行风险性评价。X ray fluorescence spectrometry was used to determine 19 kinds of elements in electronic and electrical products. The selection of characteristic X ray and counting time were discussed,and the standard curve was drawn by self-made standard block. The method had good accuracy and precision. At the same time,using the MAPPING function to carry out the situ scanning on micro area,the distribution of 19 kinds of elements could be grasped quickly. Finally,conversion factor could be used to calculate the content of REACH SVHC.The possibility of the existence of 19 kinds of elements in the product material was also discussed. Risk assessment of 19 kinds of elements in the electronic and electrical products was realized.

关 键 词：XRF 电子电气产品 快速无损 分布研究 风险评估 

分 类 号：TG115.22[金属学及工艺—物理冶金]