光电稳定平台角位移高精度测量方法研究  

Research on high precision measurement of the photoelectric stabilized platform angular displacement

作　　者：张宇鹏[1,2] 

机构地区：[1]中国科学院航空光学成像与测量重点实验室,长春130033 [2]中国科学院长春光学精密机械与物理研究所,长春130033

出　　处：《国外电子测量技术》2015年第10期54-57,共4页Foreign Electronic Measurement Technology

摘　　要：为了实现对光电稳定平台方位和俯仰框架运动角度的高精度测量,本研究使用了一种新型的非接触式高精度电容传感器。利用偏心原理,合理布置电容式传感器的位置,使方位框架和俯仰框架的几何中心与电容式传感器的检测面旋转中心不重合。当方位框架和俯仰框架分别绕着方位轴和俯仰轴运动时,其检测面与传感器之间的距离会产生变化,通过距离的变化可以测量出方位框架和俯仰框架角度的变化。依据偏心原理设计了一套测量装置,测量结果表明电容式传感器测量的距离值与其对应的角度值有良好的线性度,电容式传感器的测量精度优于15",完全满足光电稳定平台方位框架和俯仰框架角位移的测量要求。In order to achieve a high-precision measurement of the photoelectric stabilized platform azimuth and elevation angle of movement of the frame,the paper uses a novel high-precision non-contact capacitance sensor.According to the eccentric principle,the location of the capacitance sensor can be reasonably arranged,which avoids the geometric center of the azimuth and elevation frame framework overlap with the rotation center of the detection surface on the capacitance sensor.When the azimuth and elevation frame respectively move around their own axes,the distance between the detection surface and the sensor will change.Measuring the changes in the distance can find the changes in the orientation of the frame and the pitch angle of the frame.Based on the eccentric principle,a measuring device is designed.The measurement results show that the capacitance sensor has good linearity,and its accuracy is better than the 15＂,fully meet the photoelectric stabilized platform framework angular displacement measurement requirements.

关 键 词：光电稳定平台 电容式传感器 测量 

分 类 号：TN06[电子电信—物理电子学]