ADP2381稳压芯片的过压保护ATE测试研究  

Research of overvoltage protection testing on ATE of ADP2381

作　　者：俞加伟[1] 齐金鹏[1] 姚黄[1] 

机构地区：[1]东华大学信息科学与技术学院,上海201600

出　　处：《电子设计工程》2015年第21期117-119,126,共4页Electronic Design Engineering

基　　金：国家自然科学基金资助项目(61104154)

摘　　要：本文首先介绍了芯片行业常用的测试方法和ATE(Automatic Test Equipment)测试的一般原理。根据ADP2381稳压芯片的系统构架和特点给出了该芯片的主要测试指标。结合ATE测试的技术优势,基于软件测试技术,以ADP2381过压保护功能为实例,提出了一种基于ATE测试系统的整体设计方案。测试结果表明该ATE测试系统能很好地完成ADP2381芯片过压保护功能的完好性测试。Firstly,the paper introduced the general principle of ATE testing and test methods commonly used in the industry. Then, according to the system architecture and the characteristics of ADP2381,bring up the main test indicators. Combined with the technological advantages of ATE test and based on software testing techniques , with ADP2381 overvoltage protection for instance, proposes a integral design project based on the ATE test system. Test results showed that the ATE test system can accomplish very well integrity test of overvoltage protection functions of ADP2381.

关 键 词：电源管理 ATE测试 ADP2381 过压保护 

分 类 号：TN307[电子电信—物理电子学]