Improvement of Surface Morphology of Yttrium-Stabilized Zirconia Films Deposited by Pulsed Laser Deposition on Rolling Assisted Biaxially Textured Substrate Tapes  

作　　者：王梦麟 刘林飞 李贻杰 

机构地区：[1]Department of Physics and Astronomy,Shanghai Jiao Tong University

出　　处：《Chinese Physics Letters》2015年第11期101-105,共5页中国物理快报（英文版）

基　　金：Supported by the ITER Project of the Ministry of Science and Technology of China under Grant No 2011GB113004;the Shanghai Commission of Science and Technology under Grant No 11DZ1100402;the Youth Fund of the National Natural Science Foundation of China under Grant No 11204174

摘　　要：The surface morphology of buffer layer yttrium-stabilized zirconia （YSZ） of YBa2CuaO7-σ （YBCO） high temperature superconducting films relies on a series of controllable experimental parameters. In this work, we focus on the influence of pulsed laser frequency and target crystalline type on surface morphology of YSZ films deposited by pulsed laser deposition （PLD） on rolling assisted biaxially textured substrate tapes. Usually two kinds of particles are observed in the YSZ layer： randomly distributed ones on the whole film and self-assembled ones along grain boundaries. SEM images are used to prove that particles can be partly removed when choosing dense targets of single crystalline. Lower frequency of pulsed laser also contributes to a smoother film surface. TEM images are used to view the crystalline structure of thin film. Thus we can obtain a basic understanding of how to prepare a particle-free YSZ buffer layer for YBCO in optimized conditions using PLD. The YBCO layer with nice structure and critical current density of around 5 MA/cm2 can be reached on smooth YSZ samples.The surface morphology of buffer layer yttrium-stabilized zirconia （YSZ） of YBa2CuaO7-σ （YBCO） high temperature superconducting films relies on a series of controllable experimental parameters. In this work, we focus on the influence of pulsed laser frequency and target crystalline type on surface morphology of YSZ films deposited by pulsed laser deposition （PLD） on rolling assisted biaxially textured substrate tapes. Usually two kinds of particles are observed in the YSZ layer： randomly distributed ones on the whole film and self-assembled ones along grain boundaries. SEM images are used to prove that particles can be partly removed when choosing dense targets of single crystalline. Lower frequency of pulsed laser also contributes to a smoother film surface. TEM images are used to view the crystalline structure of thin film. Thus we can obtain a basic understanding of how to prepare a particle-free YSZ buffer layer for YBCO in optimized conditions using PLD. The YBCO layer with nice structure and critical current density of around 5 MA/cm2 can be reached on smooth YSZ samples.

关 键 词：YSZ Improvement of Surface Morphology of Yttrium-Stabilized Zirconia Films Deposited by Pulsed Laser Deposition on Rolling Assisted Biaxially Textured Substrate Tapes PLD 

分 类 号：O484[理学—固体物理]