基于时间门技术的纳米显微镜原理及应用  

The principle and the application of time gating in nanoscopy

作　　者：侯尚国 王坤[1] 王丽华[1] 黄庆[1] 邓素辉[1] 

机构地区：[1]中国科学院上海应用物理研究所物理生物学研究室,上海201800

出　　处：《中国科学：化学》2015年第11期1206-1213,共8页SCIENTIA SINICA Chimica

基　　金：国家自然科学基金(61378062);国家重大科研仪器设备研制专项(21227804)资助

摘　　要：很久以来,光学显微镜的分辨率受限于光学衍射极限.最近几年,发展了很多突破光学衍射极限的技术方法.其中,受激发射损耗(stimulated emission depletion,STED)显微镜因能够提供超快超高的分辨率而备受关注.在这类方法中,脉冲式STED分辨率较高但搭建复杂;连续光STED虽然搭建简单,但分辨率有所下降;时间门调制STED(gated-STED,g STED)在简化STED搭建的同时,又可以实现与脉冲式STED相比拟的分辨率.本文详细介绍了时间门在STED纳米显微镜中的应用.For a long time, the resolution of optical microscopy has been limited by diffraction. In recent years, many methods have been developed to break the diffraction barrier. Among them, stimulated emission depletion（STED） microscopy becomes very popular for being able to provide high speed and high resolution imaging. The pulsed STED can provide higher resolution but its construction is rather complex. STED with continuous wave can be built easier but its resolution is deteriorated. Applying time gating in the STED with continuous wave（g STED） can further improve the resolution. In this paper, we discussed the principle and the application of time-gating in STED.

关 键 词：超分辨成像 时间门 纳米显微镜 受激发射损耗显微镜 

分 类 号：TH742[机械工程—光学工程]