Hole-doping of mechanically exfoliated graphene by confined hydration layers  

作　　者：Tjeerd R. J. Bollmann Liubov Yu. Antipina Matthias Temmen Michael Reichling Pavel B. Sorokin 

机构地区：[1]Inorganic Materials Science, MESA+ Institute for Nanotechnology, P. O. Box 217, 7500AE Enschede, The Netherlands [2]Fachbereich Physik, Universitat OsnabrClck, BarbarastraBe 7, OsnabrClck 49076, Germany [3]Moscow Institute of Physics and Technology, Dolgoprudny 141700, Russian Federation [4]Siberian Federal University, Krasnoyarsk 660041, Russian Federation [5]National University of Science and Technology MISiS, Moscow 119049, Russian Federation

出　　处：《Nano Research》2015年第9期3020-3026,共7页纳米研究（英文版）

摘　　要：By the use of non-contact atomic force microscopy （NC-AFM） and Kelvin probe force microscopy （KPFM）, we measure the local surface potential of mechanically exfoliated graphene on the prototypical insulating hydrophilic substrate of CAF2（111）. Hydration layers confined between the graphene and the CaF2 substrate, resulting from the graphene＇s preparation under ambient conditions on the hydrophilic substrate surface, are found to electronically modify the graphene as the material＇s electron density transfers from graphene to the hydration layer. Density functional theory （DFT） calculations predict that the first 2 to 3 water layers adjacent to the graphene hole-dope the graphene by several percent of a unit charge per unit cell.

关 键 词：graphene non-contact ATOMIC forcemicroscopy (NC-AFM KPFM) liquid-solid interfacestructure electronic TRANSPORT innanoscale materials andstructuresgraphene non-contact ATOMIC forcemicroscopy (NC-AFM KPFM) liquid-solid interfacestructure electronic TRANSPORT innanoscale materials andstructures 

分 类 号：O[理学]