InSb焦平面探测器高低温循环特性研究  

Thermal cycle characteristic of InSb focal plane array detector

作　　者：王洋[1] 鲁星[2] 孟超[1,3] 刘俊明[1,3] 邝永变[1,3] 孟庆端[4] 朱旭波[1,3] 司俊杰[1,3] 

机构地区：[1]中国空空导弹研究院,河南洛阳471099 [2]驻中国空空导弹研究院军事代表室,河南洛阳471099 [3]红外探测器技术航空科技重点实验室,河南洛阳471099 [4]河南科技大学电子信息工程学院,河南洛阳471003

出　　处：《红外与激光工程》2015年第12期3701-3706,共6页Infrared and Laser Engineering

基　　金：国家自然科学基金(YGZJJ02)

摘　　要：制冷型In Sb红外焦平面探测器工作时需降温至低温(80 K),器件在整个生命周期会经受从常温(300 K)到低温(80 K)的上千次高低温循环。针对该型探测器开展了高低温循环特性试验,测试和分析了上千次高低温循环过程中器件光电性能、杜瓦热负载和J-T制冷器特性的变化。试验结果表明,探测器可以经受至少2 000次高低温循环,并且探测率变化的幅度≤5.5%、响应率变化的幅度≤4.8%、盲元数未发生增加。研究结果为器件的工艺研发和改进提供了参考。The cooled InSb infrared focal plane array（IRFPA） detectors should work in the temperature as low as 80 K. As a result, detectors are commonly subjected to thousands of thermal cycle from 80 K to room temperature（300 K） in the entire life cycle. Thermal cycle characteristic of the i[nSb IRFPA detector was studied. The FPA photoelectric parameter, Dewar heat load and J-T cooling characteristics were analyzed. The results indicated that the maximal fluctuation of the detectivity was 5.5%, the maximal fluctuation of the responsivity was 4.8%, and the number of dead pixels did not increase. The experimental results exhibited that the detectors could undergo at least 2 000 thermal cycles, which provides reference for the research and improvement of detector fabrication.

关 键 词：InSb焦平面探测器 高低温循环 参数变化 可靠性 

分 类 号：TN215[电子电信—物理电子学]