微波电路基片复介电常数无损测量的简单方法  

A simple method for nondestructive measurement of the complex permittivity of substrates at microwave frequencies

作　　者：田步宁[1] 杨德顺[1] 唐家明[1] 刘其中[1] 

机构地区：[1]西安电子科技大学天线与微波技术国家重点实验室,陕西西安710071

出　　处：《西安电子科技大学学报》2002年第4期543-546,共4页Journal of Xidian University

基　　金：国家部委科技预研跨行业基金资助项目 (98J17 5 2 DZ0 13 3 )

摘　　要：提出了一种无损测量微波电路基片复介电常数的简单方法 .该方法把被测材料及取样器等效为测量网络与误差网络的并联 ,得到了复介电常数无损测量的计算公式 .理论分析与实验结果表明 :与传统的“场”分析方法相比 ,该方法具有模型简单、计算量小、精度较高且容易实现的优点 .另外 ,对于材料置于封闭波导或同轴线中的有损测量情况 。A simple method for nondestructive measurement of the complex permittivity of substrates at microwave frequencies is presented. Materials under test and holders are equivalent to the parallel connection of a measurement network and an error network, with the equation for determining the complex permittivity of substates obtained. The theoretical analysis and expermental results show that this method has some advantages over those traditional methods of field analysis, such as simple model, fast computation, high accuracy and easy realization. In addition, this method is also applicable to destructive measurement of complex permittivity of materials placed inside a rectangular waveguide cell or a coaxial line cell.

关 键 词：电路基片 无损测量 复介电常数 微波集成电路 微带电路 

分 类 号：TN454[电子电信—微电子学与固体电子学] TN455