基于STM32高速误码测试仪设计与实现  

Design and Implementation of High Speed Bit Error Rate Tester Based on STM32

作　　者：吴柏昆 贾涵阳 余文志 吴锋[1] 钱银博[1] 

机构地区：[1]华中科技大学光学与电子信息学院,湖北武汉430074

出　　处：《仪表技术与传感器》2015年第9期31-34,共4页Instrument Technique and Sensor

摘　　要：针对目前市场上主流的国外误码仪价格昂贵,操作复杂的现象,设计了一种基于STM32的高速误码测试仪。该仪器具有4个测试信道,每个信道能涵盖9.9~11.3 Gbps间的标准协议测试速率,支持多种伪随机码输出及误码率同步显示,具有良好触摸屏控制的人机界面。本文对该测试仪的硬件和软件进行了具体阐述。测试结果证明,该测试仪满足误码测试的需求,具有可靠性高,操作简单,价格较低的特点。Due to the high price and complex operation of the mainstream foreign bit error rate testers at present, a high speed bit error rate tester that based on STM32 was designed. The tester was provided with four test channels which covered the speed of standard protocol from 9.9 Gbps to 11.3 Gbps, and it also supported multiple pseudo-random codes outputting and can synchronous- ly display the bit error rate with well touchscreen-controlled human interface. A specific description about the hardware and soft- ware of the tester was made in this paper. The results of the test experiment prove that the tester can meet the demand of bit error testing which has the features of high reliability, simple operation and low price.

关 键 词：STM32 高速误码测试仪 眼图 误码率 人机交互 

分 类 号：TM93[电气工程—电力电子与电力传动]