基于STM32的高精度薄膜宽度控制仪设计  

Design of High-accuracy Film Width Control Instrument Based on STM32

作　　者：黄峰[1] 周国平[1] 仲骥 王鑫鑫[1] 

机构地区：[1]南京林业大学信息科学技术学院,江苏南京210037

出　　处：《仪表技术与传感器》2015年第9期38-39,43,共3页Instrument Technique and Sensor

摘　　要：针对我国国产薄膜宽度控制设备精度不高,设备可靠性低的现状,设计了一种基于STM32F103C的高精度薄膜宽度控制仪。利用反射式红外光电传感器TCRT5000控制薄膜精度并通过线阵CCD在线检测吹膜过程的薄膜宽度,若超出设定范围,则调节PWM波占空比,将塑料薄膜的宽度控制在设定的范围之内。实验表明:该系统提高了塑料薄膜的精度以及系统的可靠性,精度可达0.1 mm。Aiming at the low precision and reliability of domestic film width control instrument in our country,a high-accuracy film width control instrument based on STM32F103 C was designed.Using the reflected infrared photoelectric sensor TCRT5000 to control the precision of film and detect the film width of blowing process online through the linear CCD,if the width exceeds the setting range,then regulate the PWM duty cycle to control the width of plastic film within the setting range.Experimental results show that the system improves the accuracy of plastic film and the reliability of the system,and the precision can reach 0.1 mm.

关 键 词：薄膜宽度控制 高精度 STM32F103C 线阵CCD 可靠性 

分 类 号：TP23[自动化与计算机技术—检测技术与自动化装置]