CR技术与胶片射线照相技术检测能力的对比  

Comparisons of Inspection Capability between CR Technology and Film Radiographic

作　　者：马海全[1,2] 李蓓[1,2] 何有都 米刚[1,2] 王洪勋[1,2] 史亦韦[1,2] 

机构地区：[1]北京航空材料研究院,北京100095 [2]航空材料检测与评价北京市重点实验室,北京100095

出　　处：《无损检测》2015年第12期38-40,45,共4页Nondestructive Testing

摘　　要：对CR技术和胶片射线照相技术的记录介质结构、对比灵敏度以及缺陷检测能力进行了对比。结果表明,CR技术在对比灵敏度和缺陷检出能力方面,与胶片射线照相技术基本达到同等技术水平;CR技术具有比胶片射线照相技术宽容度大、曝光量小的优点,可大大提高工作效率,但CR技术对散射线较为敏感,在使用过程中应注意散射线的防护。In this paper,the recording media,contrast sensitivity and defect detection conditions of CR technology and film radiographic inspection were compared.The result shows that the contrast sensitivity and defect detections of CR technology and film radiographic inspection reached the same level of technology,and at the same time CR technology has the latitude and less exposure compared with the radiographic inspection.The CR can improve efficiency greatly,but scattered rays should be protected because CR technology is very sensitive to them.

关 键 词：CR技术 胶片射线照相技术 IP板 

分 类 号：TG115.28[金属学及工艺—物理冶金]