表面误差对双弯曲反射面天线副瓣的影响  

Effects of Doubly Curved Reflector Surface Errors on Sidelobe Levels

作　　者：沈均好[1] 李红梅[1] 李怀珠[1] 张恒源[1] 

机构地区：[1]南京长江电子信息产业集团有限公司,南京210038

出　　处：《现代雷达》2016年第1期61-64,共4页Modern Radar

摘　　要：天线反射面的表面误差会引起反射面天线的副瓣发生变化。为确定赋形波束双弯曲反射面天线反射面的表面误差与反射面天线副瓣最大值变化之间的关系,采用数理统计的方法,对受到随机表面误差影响的面电流积分,得到天线辐射场。随机表面误差用相关半径和Z向随机误差两个参量表示。根据随机表面误差求出其天线最大副瓣样本分布函数,较好地展现了表面误差引起的副瓣最大值变化,使得反射面天线表面误差引起的副瓣变化可预测,为天线反射面加工的精度要求提供了理论依据。It is known that the sidelobe level of a reflector antenna is susceptible to random surface errors. Because of the uncer- tainty of the random surface errors, this problem is studied in the probabilistic sense, treating the shaped beam doubly curved re- flector antenna pattern obtained by integration of distorted surface current as a random function, the probability distribution of the maximum sidelobe levels with different random surface errors are obtained. Random surface errors are on the basis of the character- istic correlation radii and distortions on the Z direction. The relation between the maximum sidelobe levels and random surface er- rors is made clear, and the effects of reflector random surface errors on the maximum sidelobe levels are made predictable, and it would be the theoretical bases for the tolerances of reflector surface.

关 键 词：低副瓣 表面误差 电磁仿真 分布函数 

分 类 号：TN823.27[电子电信—信息与通信工程]