检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
出 处:《理化检验(物理分册)》2016年第1期17-20,共4页Physical Testing and Chemical Analysis(Part A:Physical Testing)
基 金:西部材料科技创新基金资助项目(XBCL-1-05)
摘 要:单晶晶面偏离角的测定是单晶生长和加工过程中的重要环节,通过试验比较研究了两种测定难熔单晶晶面偏离角方法的优缺点。结果表明:在试样高速旋转同时对试样进行固定2θ角扫描的θ扫描方法,能够快速准确地测定出偏离角,测定效率高,完全可以满足现阶段单晶生产过程中对晶面偏离角测定的要求。而另一种方法是由(ω,φ)二维数据确定出晶面偏离角和晶面方位,但该方法测试时间过长,效率低下。It was of great importance to measure the crystal plane orientation deviation angle of refractory monocrystals during the growth and fabrication process. The advantages and disadvantages of two measuring methods of the orientation deviation angle of refractory monocrystals were compared and analyzed through experiments. The results show that the crystallographic orientation angle could be accurately and effectively measured by θ scanning method of scanning samples with the fixed 2θ angle during high-speed rotating. It could satisfy the measuring needs on orientation deviation angle of monocrystals in practical monocrystal fabrication. The orientation deviation angle and the crystallographic orientation could also be measured by another method through two-dimensional data( ω,φ). But in this method the measuring time was too long and the efficiency was too low.
分 类 号:TG115.222[金属学及工艺—物理冶金]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.229