双V型六光幕阵列测试精度分析  

Measurement Accuracy Analysis of Double-V Shaped Six-light-screen Array

作　　者：陈瑞[1] 倪晋平[1] 胡旭 

机构地区：[1]西安工业大学光电工程学院,西安710032 [2]重庆长安工业(集团)有限责任公司,重庆401120

出　　处：《光电工程》2016年第1期24-29,共6页Opto-Electronic Engineering

基　　金：国家自然科学基金(61471289);西安工业大学"兵器光电测试技术与仪器"科研创新团队资助项目

摘　　要：光幕阵列测试射击密集度已在靶场得到应用,阵列的结构参数直接影响测试精度。本文针对双V型六光幕阵列,理论分析了结构参数、弹丸入射角度及弹丸入射位置对弹丸速度测试精度和坐标测试精度的影响,并建立测试误差传播公式,通过MATLAB仿真得到了各因素影响弹丸速度和坐标测试精度的规律和关系曲线。文中的结果为提高六光幕阵列测试精度和工程设计优化提供了参考。Light screen array is applied to measure firing dispersion in range, and the structure parameters of the array influences the measuring result directly. Based on double-V shaped six-light-screen array, the influence of the structure parameter, the angles of incidence and the impact location to the measurement accuracy of velocity and coordinates are analyzed, and then the error transfer formulas are deduced. The relations between the measurement accuracy of velocity and coordinates to each influence factors are simulated and plotted in MATLAB. The conclusion provided a reference for improving the measuring accuracy and optimizing the engineering design.

关 键 词：六光幕阵列 结构参数 弹丸 测试精度 

分 类 号：TP202.2[自动化与计算机技术—检测技术与自动化装置] TJ012.36[自动化与计算机技术—控制科学与工程]