三模冗余失效检测智能算法设计  

Design of smart testing algorithm for faults caused by triple modular redundancy

作　　者：赵国亮[1] 祁麟 蒋勇[3] 

机构地区：[1]中国航天科工集团第二研究院706所,北京100854 [2]航天东方红卫星有限公司,北京100081 [3]中国航天五院503所,北京100094

出　　处：《计算机工程与设计》2016年第2期418-423,共6页Computer Engineering and Design

摘　　要：针对三模冗余结构可能导致FPGA软件失效的问题,提出一种错误注入的动态测试方法。将三模冗余设计生成的网表转化为有向图,通过回溯路径并遍历节点的配置输入值来判断三模冗余结构的正确性,针对驱动较多的节点,采用分解算法将有向图拆分成子图进行分析,对子图中寄存器的配置输入进行组合遍历计算寄存器的值,确定寄存器是否对单粒子翻转(SEU)敏感。该方法将动态测试中的错误注入方法和静态测试中的网表功能点比对结合起来,采用数学方法进行处理,降低了算法复杂度与测试时间成本。The TMR method aiming at safety and reliability improvement may become an error-amplified mechanism,a smart testing algorithm for faults caused by TMR was proposed.All the netlists in the triple modular redundancy design were switched into directed graph,and functional identical nodes were found by traversing through the back path and calculating all the value of configurations.For those nodes whose number of drivers exceeded a threshold,the directed graph was spilt into subgraphs by applying the splitting algorithm.The configurations were traversed to calculate the value of a Flip-Flop and it was compared with agolden module to judge whether the Flip-Flop is SEU sensitive.This method combines fault injection method in dynamic test with functional identification in static analysis using mathematical methods,greatly reducing the complexity of the algorithm and the time cost of tests.

关 键 词：三模冗余 测试 算法 智能 有向图 

分 类 号：TP3[自动化与计算机技术—计算机科学与技术]