MOV多片并联在冲击老化过程中温度差的变化  

Temperature Difference Changing of the Multi-chip MOV in Parallel in the Process of Impulse Aging

作　　者：楼嘉懿 杨仲江[1] 姜苏[1] 刘欣[1] 顾欧韵 

机构地区：[1]南京信息工程大学中国气象局气溶胶与云降水重点开放实验室,南京210044 [2]南京工业大学材料化学工程国家重点实验室,南京210009

出　　处：《电瓷避雷器》2016年第1期49-54,共6页Insulators and Surge Arresters

基　　金：国家自然科学基金项目(编号:41175003);江苏高校优势学科建设工程资助项目(PAPD)

摘　　要：通过冲击实验,红外温枪测温,SEM扫描电镜分析表征等实验手段研究了MOV多片并联在冲击老化过程中温度差的变化。研究表明:在长期电涌冲击下,并联体中各MOV受损情况不尽相同,受损较严重的MOV甚至会出现穿晶破坏现象,将导致其阻性与其他MOV的阻性产生很大差异,当再次经受电涌冲击时其将会吸收更多的冲击电流,这样就会造成各MOV的通流量不同,从而产生温度差。根据此现象,设计了一种嵌入式多点温度无线监控系统,该系统能判断电涌保护器中各MOV的配合情况以及整体的老化程度,具有针对性强,实时高效的特点。The temperature difference change impulse aging is investigated by means of the measurement, SEM characterization. It shows that, of multi-chip MOV in parallel in the process of impulse test, infrared thermometer temperature in the long term stressing of surges, each MOV is damaged differently. With the accumulation of time, more serious damage MOV will appear transgranular failure phenomena. It will lead to a big gap in resistive between each of MOV. When subjected to surges again, it will absorb more of the impulse current. This will cause that different MOV flows through different current, and result in temperature difference. Focusing on this phenomenon, an embedded multi-point temperature wireless monitoring system that can cope with the situation and determine the overall extent of the aging of each MOV surge protector is designed which has features of target, efficient and real-time.

关 键 词：MOV多片并联 穿晶破坏 电涌冲击 温度 嵌入式多点温度无线监控系统 

分 类 号：TM862[电气工程—高电压与绝缘技术]