基于双端口通信的光栅光谱仪设计方法  

Improved design method of grating spectrometer based on dual port communication

作　　者：侯喜报[1] 张志辉[1] 刘磊[1] 韩顺利[1] 罗文建[1] 

机构地区：[1]中国电子科技集团公司第四十一研究所电子测试技术重点实验室,山东青岛266555

出　　处：《光学仪器》2016年第1期73-78,共6页Optical Instruments

基　　金：重点实验室基金资助项目(9140C120301110C12)

摘　　要：针对单片机作为主控及数据处理平台的光栅光谱分析仪具有电路复杂、可靠性差、测量速度慢等诸多局限性,提出一种基于工控板作为主控及数据处理平台的光栅光谱分析仪设计方法。该方法根据双口RAM双端口通信机制和查询测量参数指令地址的软件设计方法,采用FPGA控制PC/104总线作为主控及数据处理平台与双口RAM数据通信及控制总线,在兼容原有系统成熟模块的前提下,实现工控板对光谱分析仪参数设置和数据测量。实验结果表明,该方法切实可行,且相对于原有光谱分析仪产品,平均测量时间缩短83.7%。The grating spectrometers using microchip as the main control and data processing module have disadvantages of circuit complexity,poor reliability,slow scanning speed and many other limitations.To overcome the shortcomings,an improved design method of grating spectrometer in which an industrial control board was adopted as the main control and data processing module was proposed.Based on a dual port communication scheme of dual-port RAM(DPRAM)and the software design method of inquiring parameter command address table,FPGA was used to control the PC/104 bus as the data communication and control bus of the main control and data processing module and DPRAM.Under the premise of compatible with existing system modules,this method can realize parameter setting of the spectrometer and data measurements.The experimental results show that the method was practical and the average measurement time was reduced by 83.7% compared with the original spectrometer products.

关 键 词：光谱分析仪 双口RAM 地址查询 缩短测量时间 

分 类 号：TH744.1[机械工程—光学工程]