Impact of stray charge on interconnect wire via probability model of double-dot system  

Impact of stray charge on interconnect wire via probability model of double-dot system

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作  者:陈祥叶 蔡理 曾强 王新桥 

机构地区:[1]Flight Instructor Training Base,Air Force Aviation University,Bengbu 233000,China [2]College of Science,Air Force Engineering University,Xi'an 710051,China

出  处:《Journal of Semiconductors》2016年第2期14-19,共6页半导体学报(英文版)

基  金:supported by the National Natural Science Foundation of China(No.61172043);the Key Program of Shaanxi Provincial Natural Science for Basic Research(No.2011JZ015)

摘  要:The behavior of quantum cellular automata (QCA) under the influence of a stray charge is quantified. A new time-independent switching paradigm, a probability model of the double-dot system, is developed. Superiority in releasing the calculation operation is presented by the probability model compared to previous stray charge analysis utilizing ICHA or full-basis calculation. Simulation results illustrate that there is a 186-nm-wide region surrounding a QCA wire where a stray charge will cause the target cell to switch unsuccessfully. The failure is exhibited by two new states' dominating the target cell. Therefore, a bistable saturation model is no longer applicable for stray charge analysis.The behavior of quantum cellular automata (QCA) under the influence of a stray charge is quantified. A new time-independent switching paradigm, a probability model of the double-dot system, is developed. Superiority in releasing the calculation operation is presented by the probability model compared to previous stray charge analysis utilizing ICHA or full-basis calculation. Simulation results illustrate that there is a 186-nm-wide region surrounding a QCA wire where a stray charge will cause the target cell to switch unsuccessfully. The failure is exhibited by two new states' dominating the target cell. Therefore, a bistable saturation model is no longer applicable for stray charge analysis.

关 键 词:quantum cellular automata interconnect wire stray charge probability model of double-dot system 

分 类 号:TN405.97[电子电信—微电子学与固体电子学]

 

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