非均匀辐照下光伏组件旁通二极管可靠性研究  

STUDY OF BYPASS DIODE RELIABILITY UNDER NON-UNIFORM IRRADIANCE DISTRIBUTION ON PV MODULE SURFACE

作　　者：张臻[1] 王磊[1] 蔡一凡[1] 丁坤[1] 全鹏[2] 徐健美[2] 

机构地区：[1]河海大学机电工程学院,常州213022 [2]常州天合光能有限公司光伏科学与技术国家重点实验室,常州213031

出　　处：《太阳能学报》2016年第2期355-360,共6页Acta Energiae Solaris Sinica

基　　金：江苏省自然科学基金(BK20151173);中央高校基本科研业务费项目(2014B19614);工信部电子信息产业发展基金(2014)

摘　　要：通过调研光伏组件室外运行与室内测试条件下光伏旁通二极管实际失效数据,分析光伏旁通二极管失效概率与工作温度、运行时间等的关系。通过环境箱和双极电源结合,设置高温加正向偏置、高低温循环加正向偏置、高低温循环加反向偏置、正反向偏置循环的室内测试条件,模拟典型光伏组件表面非均匀辐照分布情况下旁路二极管的工作情况并进行耐久性实验。实验结果表明:较高环境温度时,因固定遮挡引起的旁通二极管长期正向偏置情况下,光伏组件存在失效风险。According to the investigation data of PV module failure in the field and bypass diode reliability experimental results of indoor tests, the relationship between diode failure possibility and operating temperature, time, heat transfer was analyzed. The environment chamber combined with bipolar power supply was used to simulate 4 types of indoor bypass diode operating conditions of non-uniform irradiance distribution on PV module surface, including high temperature plus forward bias, thermal cycle plus forward bias, thermal cycle plus reverse bias, forward and reverse bias cycling. And the related bypass diode durability test was completed. The experimental results show that there are some reliability risks for forward bias bypass diodes caused by long-time shaded PV module under higher environment temperature.

关 键 词：可靠性 光伏组件 旁通二极管 热斑 

分 类 号：TN313[电子电信—物理电子学]