Si-PIN探测器灵敏体积最优厚度的MC模拟  

Monte Carlo Simulations of the Thickness of the Sensitive Volume in Si- PIN Type X- ray Detector

作　　者：李柯[1,2] 吴和喜[1,2] 严川[2] 

机构地区：[1]东华理工大学核技术应用教育部工程研究中心,南昌330013 [2]东华理工大学核工程与地球物理学院,南昌330013

出　　处：《核电子学与探测技术》2015年第10期985-988,共4页Nuclear Electronics & Detection Technology

基　　金：国家自然科学基金(11205031);核技术应用教育部工程研究中心基金(HJSJYB2014-7;HJSJYB2014-8)资助

摘　　要：Si-PIN探测器灵敏材料厚度影响探测时间、探测结果可靠性及设备价格。从能量响应谱的比对研究证实EGS4模拟适用于Si-PIN探测器能量色散X荧光仪的设计分析。通过不同入射X射线对不同厚度灵敏体积的Si-PIN探测器的能量响应模拟研究发现:探测器灵敏体积最优厚度随待测X射线的能量增加而变厚,厚度与特征峰计数或峰总比的饱和厚度相等。Real time of detection, the reliability of the detecting results and the cost of detector are affected by thickness of the sensitive material in Si - PIN semiconductor detector. EGS4 platform is appropriate for the study of energy - dispersive X - ray fluorescence design and analysis by the comparison of the simulated and the real detector energy response. A lot of detector response spectrum from these ＇interactions between different thickness of the sensitive material in Si - PIN type X - ray detector and different energy of X - ray was acquired based on EGS4 platform. Count of characteristic peak and Peak - to - Total ratio was applied to depict the performance of Si - PIN semiconductor detector and calculate from the above detector response spectrum. The study found that the saturation thickness goes up with energy increasing, and optimal thickness of the sensitive volume is equal with the saturation thickness of count of characteristic peak and Peak - to - Total ratio.

关 键 词：最优厚度 SI-PIN探测器 EGS4平台 

分 类 号：TL814[核科学技术—核技术及应用]