介质谐振器法测量超导薄膜微波表面阻抗  

SURFACE IMPEDANCE MEASUREMENTS OF SUPERCONDUCTING FILMS BY MEANS OF SAPPHIRE DIELECTRIC RESONATORS

作　　者：胡宗渝[1] 吉争鸣[1] 金飚兵[1] 

机构地区：[1]南京大学超导电子研究所,南京210093

出　　处：《低温物理学报》2016年第1期27-30,共4页Low Temperature Physical Letters

摘　　要：本文所用的测试方法为蓝宝石介质谐振器法,它采用一片超导薄膜替代谐振器的一端,通过测量微波介质谐振腔的品质因数和谐振频率随温度变化来确定超导薄膜的微波表面阻抗.本文设计和制作了一个工作于TE01δ模式,谐振频率在18.3GHz左右的蓝宝石介质谐振器,其无载品质因数在3K时可达到130000.用此方法可以对薄膜进行无损伤测量,测量后的薄膜还可继续使用.We use the sapphire dielectric resonator technique to measure the microwave surface impedance （Z,） of superconducting film. The superconductive film is placed at the end of the sapphire puck to form a dielectric resonator with a supercoducting wall. This resonator is working at 18. 3 K （TE01δ mode） with a temperature range from 3 K to room temperature. Zs can be determined by measuring the temperature dependence of the unloaded quality factors and the resonator frequency. We measured the surface impedance of two Nb films, and the highest quality factor is up to 130000. The films can be tested without damage and the surface impedance can be measured accurately.

关 键 词：介质谐振器 超导薄膜 微波表面阻抗 品质因数 

分 类 号：O484[理学—固体物理]