某型空空导弹电子部件加速贮存寿命试验方法研究  

Testing Method Study of Accelerated Storage Life for Electronic Components in Certain Air-to-Air Missile

作　　者：席运洋[1] 刘万远[1] 鲍华[1] 

机构地区：[1]中国空空导弹研究院,河南洛阳471009

出　　处：《航空兵器》2016年第1期64-68,共5页Aero Weaponry

摘　　要：为挖掘某型空空导弹电子部件贮存寿命的潜力,提出一种以加速寿命试验为基础的试验方法。通过分析产品贮存期应力、寿命薄弱环节、寿命分布特征、适用的加速模型等,设计了试验方案。由试验得到产品真实的贮存寿命,通过与产品实际使用情况对比,证明了该试验方法的合理性。该试验方法可推广应用于其他航空武器装备。To mine the storage life potential of electronic components of a certain air-to-air missile,a testing method based on the accelerated life testing is proposed. The stress in storage period,life weakness,life distribution,suitable accelerated model for the product are analyzed,and the testing plan is designed. The true storage life is obtained through the testing,and by comparing with the actual use of the product,the rationality of the testing method is proved. This testing method can be applied to other aviation weaponry.

关 键 词：空空导弹 加速贮存寿命 试验方法 指数分布 阿伦尼斯模型 

分 类 号：TJ760.623[兵器科学与技术—武器系统与运用工程] V216.5[航空宇航科学与技术—航空宇航推进理论与工程]