光交换芯片的串扰分析与DQPSK信号传输实验  

Crosstalk Analysis of Optical Switching Chips with DQPSK Signal Transmission Experiment

作　　者：赵元力[1] 武保剑[1] 廖明乐 耿勇[1] 邱昆[1] 

机构地区：[1]电子科技大学光纤传感与通信教育部重点实验室,四川成都611731

出　　处：《光学学报》2016年第1期157-163,共7页Acta Optica Sinica

基　　金：国家863计划(2012AA011304);国家自然科学基金(61271166);教育部创新团队发展计划

摘　　要：串扰和插入损耗是表征光交换芯片传输性能的重要参数。将串扰与插入损耗特性结合起来,提出一种分析光交换集成芯片串扰的理论模型,考虑了串扰对开关路由的依赖性。实验测量了基于马赫-曾德尔干涉仪(MZI)的4×4拜尼兹结构的光交换集成芯片的串扰和插入损耗系数,以及不同开关路由状态下40 Gb/s差分四相相移键控(DQPSK)信号的传输性能,实验结果与理论分析基本一致。根据测得的串扰和插入损耗系数,计算了16×16光交换芯片串扰范围。Crosstalk and insertion loss are two important parameters for optical switching integrated chips. A new theoretical model of crosstalk in optical switching integrated chips, which is dependent on insertion loss and switch routing states, is put forward. As an example, the crosstalk and insertion loss coefficients of the optical switching integrated chip consisting of Mach-Zehnder interferometer （MZI）-based 4×4 Benes structure are measured by the 40 Gb/s differential quadrature phase shift keying （DQPSK） experiment under different switch routing states. The experimental results are consistent with the theoretical analysis. The crosstalk range for the 16 ×16 Benes-type optical switching chips is calculated according to the given crosstalk and insertion loss coefficients.

关 键 词：光通信 光子集成芯片 光开关阵列 串扰 插入损耗 

分 类 号：O439[机械工程—光学工程]