An Easy Way to Quantify the Adhesion Energy of Nanostructured Cu/X(X=Cr,Ta,Mo,Nb,Zr) Multilayer Films Adherent to Polyimide Substrates  被引量:3

An Easy Way to Quantify the Adhesion Energy of Nanostructured Cu/X(X=Cr,Ta,Mo,Nb,Zr) Multilayer Films Adherent to Polyimide Substrates

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作  者:Kai Wu Jin-Yu Zhang Gang Liu Jiao Li Guo-Jun Zhang Jun Sun 

机构地区:[1]State Key Laboratory for Mechanical Behavior of Materials,Xi’an Jiaotong University [2]School of Materials Science and Engineering, Xi’an University of Technology

出  处:《Acta Metallurgica Sinica(English Letters)》2016年第2期181-187,共7页金属学报(英文版)

基  金:financially supported by the National Natural Science Foundation of China(Nos.51321003;51322104;51201123 and 51571157);the National Basic Research Program of China(No.2010CB631003);the 111 Project of China(No.B06025);the support from Fundamental Research Funds for the Central Universities;Tengfei Scholar project;China Postdoctoral Science Foundation(No.2012M521765);Shaanxi Province Postdoctoral Scientific Research Projects for part of financial support

摘  要:An approach based on film buckling under simple uniaxial tensile testing was utilized in this paper to quan- titatively estimate the interfacial energy of the nanostructured multilayer films (NMFs) adherent to flexible substrates. The interfacial energies of polyimide-supported NMFs are determined to be ~ 5.0 J/m2 for Cu/Cr, ~4.1 J/m2 for Cu/Ta, ~ 2.8 J/m2 for Cu/Mo, ~ 1.1 J/m2 for Cu/Nb, and ~ 1.2 J/m2 for Cu/Zr NMFs. Furthermore, a linear relationship between the adhesion energy and the interfacial shear strength is clearly demonstrated for the Cu-based NMFs, which is highly indicative of the applicability and reliability of the modified models.An approach based on film buckling under simple uniaxial tensile testing was utilized in this paper to quan- titatively estimate the interfacial energy of the nanostructured multilayer films (NMFs) adherent to flexible substrates. The interfacial energies of polyimide-supported NMFs are determined to be ~ 5.0 J/m2 for Cu/Cr, ~4.1 J/m2 for Cu/Ta, ~ 2.8 J/m2 for Cu/Mo, ~ 1.1 J/m2 for Cu/Nb, and ~ 1.2 J/m2 for Cu/Zr NMFs. Furthermore, a linear relationship between the adhesion energy and the interfacial shear strength is clearly demonstrated for the Cu-based NMFs, which is highly indicative of the applicability and reliability of the modified models.

关 键 词:Uniaxial tensile testing Nanostructured multilayer films Flexible substrates Bucklingbehaviors Adhesion energy 

分 类 号:TB383.2[一般工业技术—材料科学与工程] TB302

 

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