基因循环存储模块的SEU自检  

SEU Self-Checking of Gene Cyclic Memory Module

作　　者：李丹阳[1] 蔡金燕[1] 孟亚峰[1] 朱赛[1] 

机构地区：[1]军械工程学院电子与光学工程系,石家庄050003

出　　处：《半导体技术》2016年第4期312-318,共7页Semiconductor Technology

基　　金：国家自然科学基金资助项目(61271153;61372039)

摘　　要：胚胎电子细胞的基因循环存储模块在辐射空间容易受到单粒子翻转(SEU)影响,由于缺乏有效的自检手段,严重制约了胚胎电子阵列在深空等辐射环境中的应用。本文设计了一种新型的具有SEU自修复能力的触发器单元,并结合汉明纠错码,设计了一种新型的具有SEU自检和自修复能力的基因循环存储模块,可以在维持胚胎电子细胞阵列正常工作的情况下,实时有效的检测并修复1 bit SEU。以2 bit进位加法器为例,通过仿真实验,验证了胚胎电子细胞的SEU自检和自修复能力。The gene cyclic memory module of the embryonic electronic cell is susceptible to single event upset（ SEU） in radiation space. Due to the lack of effective means of self-test,the application of embryonic electronic array system on deep space is severely restricted. A new type of flip-flop with SEU self-test and self-repair capability was designed. Combined the hamming code, a new gene cyclic memory module with SEU self-test and self-repair capability was proposed,which could effectively detect and repair 1 bit SEU,meanwhile keep the embryonic electronic array system working normally. The results of simulations in a 2-bit ripple carry adder verify the SEU self-test and self-repair ability of the embryonic electronic cell.

关 键 词：胚胎电子细胞 基因循环存储模块 单粒子翻转(SEU) 汉明码 自修复 

分 类 号：TP302.8[自动化与计算机技术—计算机系统结构] TN43[自动化与计算机技术—计算机科学与技术]