软X射线测量用电阻式薄膜量热计  

A resistive bolometer for measuring soft X-ray radiation energy

作　　者：任晓东[1] 黄显宾[1] 王昆仑[1] 周少彤[1] 但加坤 徐强[1] 张思群[1] 李晶[1] 蔡红春[1] 欧阳凯[1] 于治国[1] 

机构地区：[1]中国工程物理研究院流体物理研究所脉冲功率科学与技术重点实验室,四川绵阳621999

出　　处：《强激光与粒子束》2016年第7期145-150,共6页High Power Laser and Particle Beams

基　　金：国家自然科学基金重点项目(10635050);中国工程物理研究院脉冲功率重点实验室基金项目(PPLF2014PZ07;PPLF2013PZ10)

摘　　要：介绍了一种用于软X射线辐射能量测量的电阻式薄膜量热计。利用电流的欧姆热效应对薄膜量热计的灵敏度进行了标定。在有基底薄膜的标定过程中,采用一维热扩散模型,考虑了金属薄膜向基底的传导热损失。利用电阻式薄膜量热计对聚龙一号装置钨丝阵Z箍缩产生的软X射线进行了测量,并与平响应X射线二极管(XRD)探测器的测量结果进行了比较。实验结果表明,电阻式薄膜量热计测量的软X射线辐射能量和辐射功率与平响应XRD探测器结果在测量不确定度范围内合理地一致。A resistive bolometer which is used to diagnose soft X-ray fluence is described.The bolometer is calibrated with Ohm heating.In the calibration scheme,heat loss into the substrate is considered with a simple one-dimensional heat conduction model.We utilize the bolometer to diagnose soft X-ray fluence of tungsten wire array Z-pinch experiments on PTS.Comparison of the bolometer measurements with a flat spectral response XRD(FSR-XRD)shows that the soft X-ray power and energy measurements from bolometers are reasonably consistent with that obtained by FSR-XRD.

关 键 词：软X射线 薄膜量热计 Z箍缩 等离子体 X射线诊断 

分 类 号：O53[理学—等离子体物理] O572[理学—物理]