Buck电路IGBT老化失效的特征分析  

Feature analysis on aging failure of IGBT in Buck circuit

作　　者：姜志鹏[1] 阎浩[1] 杨娟[1] 

机构地区：[1]金陵科技学院电子信息工程学院,江苏南京211169

出　　处：《现代电子技术》2016年第8期126-129,共4页Modern Electronics Technique

基　　金：江苏省教育厅项目(13kjd520004);国家青年科学基金项目(61302167);金陵科技学院教改项目(2015JYJG22);金陵科技学院科研基金项目(JITN201523)

摘　　要：绝缘栅双极型晶体管(IGBT)常被应用于汽车、火车的电机控制系统以及航空航天设备的开关电源中。IGBT的失效会导致系统的效率下降,严重的会直接导致系统失效。通过识别和监测IGBT失效所导致电路特性参数的变化可以做到对其失效的预测和避免。为研究IGBT老化是否会对电路输出特性造成影响,以Buck电路为研究对象,设计了大电流下便于替换IGBT的Buck电路,对IGBT进行热应力老化实验,获取老化后的IGBT,并将老化后的IGBT引入到设计的Buck中,实验分析了IGBT老化对于Buck电路输出电压的影响。得出IGBT的老化会导致Buck电路输出电压平均值增大、高频杂波幅值增大的结论,为进一步实现电路中IGBT老化的检测以及初期的故障诊断提供了可供提取的特征参数。The insulated gate bipolar transistor（IGBT） is common used in the motor control system of automobile and train,and switching mode power supply of aerospace equipment. The IGBT failure can reduce the system efficiency,or even directly results in system failure. The variation of circuit characteristic parameter caused by IGBT failure is identified and monitored to effectively predict and avoid the failure. To study whether IGBT aging can influence on the circuit output characteristics,the Buck circuit is taken as the research object to design the Buck circuit convenient for replacing IGBT under large current condition. The heat stress aging test for IGBT was performed and then the aged IGBT was obtained. The aged IGBT was introduced into the designed Buck circuit to analyze its influence on output voltage of Buck circuit. The conclusion that the aged IGBT can increase the output voltage average value of Buck circuit and amplitude of high-frequency noise wave is obtained,which provides some extractable feature parameters for IGBT aging detection and nascent fault diagnosis of the circuit.

关 键 词：IGBT BUCK电路 老化失效 特征分析 

分 类 号：TN710-34[电子电信—电路与系统]