机构地区:[1]西安交通大学理学院,西安710049 [2]西安交通大学空间光学研究所,西安710049 [3]中国科学院西安光学精密机械研究所,西安710119
出 处:《物理学报》2016年第8期36-45,共10页Acta Physica Sinica
基 金:国家自然科学基金重点项目(批准号:41530422);国家自然科学基金(批准号:61540018;61275184;61405153);国家重大专项(批准号:32-Y30B08-9001-13/15);国家高技术研究发展计划(批准号:2012AA121101);教育部高等学校博士学科点专项科研基金(批准号:20130201120047)资助的课题~~
摘 要:论述了偏振型干涉成像光谱仪的工作原理,针对复原光谱谱线位置漂移问题,提出了原理修正和数据处理两种具有代表性的实验室谱线位置定标方法,给出了定标结果及对比分析.原理修正方法从干涉型成像光谱仪的参数选择着手,分析了产生谱线位置漂移的原因,针对复原谱线位置随行变化的问题,给出了修正方案,使得谱线位置精度明显提高;对于给定的四组激光器标准波长,谱线位置均方根误差由定标前的28.3914下降至5.5371,该方法对干涉型成像光谱仪具有普适性,且其定标参数对分析仪器指标提供了便利.数据处理方法弥补了原理修正定标存在的数据量大、短波定标效果弱等弊端,谱线位置均方根误差下降至0.9178,该方法实施简单,对不同的输入波长,所取不同行的数据用统一的表达式进行修正.该方法化繁为简、间接定标的思想具有一定的借鉴价值.该研究为偏振型干涉成像光谱仪的设计、研制、调试和工程化提供了重要的理论依据和实践指导.The principle of interference imaging spectrometer is presented. According to the drift of recovery spectral line position, two representative methods of calibrating the laboratory spectral line position are proposed, and the calibration results and their comparative analyses are given. One method of calibration is to correct the principle, which embarks from parameter selection of interference imaging spectrometer and the analysis of the reason why the spectral line position is drifted. Aiming at the problem that the position of spectral line changes with row, the correction scheme is given to improve the accuracy of spectral line position. For four given laser wavelengths, which are 543.5 nm, 594.1 nm,612 nm, and 632.8 nm, the root-mean-square(RMS) error of spectral line position is reduced from 28.3914 to 5.5371 after calibration. For the interferometer system which has no dispersion, the accuracy of calibration is better than the dispersion system, and can be the same at all detected wavelengths. In this article, the calibration accuracy of long wave is better than that of short wave, which is dependent on the selection of the initial correction wavelength. This method achieves a kind of universality for interference imaging spectrometer and its calibration parameters provide a convenient way to analyze the instrument indexes. Another calibration method is data processing. It makes up the deficiencies of the method mentioned above: a large number of data are needed and the effect of calibration at short wave is not good enough. The RMS error of spectral line position is reduced to 0.9178, which proves that the calibration has a really high precision. This method is simple and can correct all the detected wavelengths and spectral lines by using two united formula. Though this method is not applicable for all the interference imaging spectrometers, the idea that makes hard things simple is deserving of our attention. We can use it in many other fields. The essence of the method is to change a variable qua
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