红外热成像无损检测技术现状及发展  

Infrared Thermography NDT and Its Development

作　　者：陈大鹏 毛宏霞[2] 肖志河[2] 

机构地区：[1]光学辐射重点实验室,北京100854 [2]北京环境特性研究所,北京100854

出　　处：《计算机测量与控制》2016年第4期1-6,9,共7页Computer Measurement &Control

摘　　要：红外热成像是近年来发展起来的一种快速有效的无损检测技术,通过主动热激励使物体内部的异性结构以表面温场变化的差异形式表现出来,实现缺陷的定位、识别和定量测量;它是一门跨学科的技术,它的研究和应用,提高了多种军、民用工业设备的安全性可靠性;综述了红外热成像无损检测技术的基本概念、关键技术原理和系统组成,比对分析了光脉冲、超声、锁相、太赫兹等各种热激励方式的技术特点,介绍了国内外相应的发展状况和进展,并给出了一些典型应用案例,最后总结了该技术的发展趋势。The Infrared Thermography is a fast and effective NDT technology which developed ten of years. The non--uniform structure under the surface becomes visualized because of the surface temperature variation by the active heat stimulation; and the locating, recognition and quantitative measurement of the defects are realized by data processing. Infrared thermography NDT is an interdisciplinary technology; the research and application of it improve the safety and reliability of variety of military and civilian equipment. In this paper, the principle, concept and system compositions of infrared thermography are briefly introduced; technical characteristics of several stimulations methods, such as light pulse, ultrasonic, Lock--in, and THz are compared and analyzed; furthermore, development of the technology at aboard and native is introduced, as well as some typical applications are shown, and finally the development trend of this technology is summarized.

关 键 词：红外热成像 无损检测 热激励 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]