基于EHW和双机热备技术的故障自修复电路系统设计  

Design of the Fault Self-repair Circuit System Based on Evolvable Hardware and Dual Hot-backup Technique

作　　者：张峻宾[1] 蔡金燕[1] 孟亚峰[1] 许杰 孙也尊 

机构地区：[1]军械工程学院电子与光学工程系,河北石家庄050003 [2]驻783厂军事代表室,四川绵阳621000 [3]驻247厂军事代表室,山西太原030000

出　　处：《微电子学与计算机》2016年第5期124-126,132,共4页Microelectronics & Computer

基　　金：国家自然科学基金项目(61372039;61271153)

摘　　要：在充分利用EHW技术的自组织、自适应及自修复优点的基础之上,权衡传统冗余容错技术的可靠性和硬件资源消耗等指标,提出了EHW与双机热备技术相结合的故障自修复电路系统.对电路系统的模型进行了设计,对故障自修复流程进行了深入分析.基于EHW和双机热备技术的故障自修复电路系统具有重要的工程应用价值.In this paper, the circuit system design based on Evolvable Hardware （EHW） and dual hot-backup technique was proposed. It made full use of the advantages of EHW. Both the reliability of traditional redundant fault-tolerant and hardware resource consumption was considered. The universal circuit model based on EHW and dual hot-backup technique was designed. The flow of fault self-repair was analyzed in detail. The fault self-repair circuit system design can be guided by it. It will have important engineering application value.

关 键 词：硬件演化 冗余容错 双机热备技术 故障自修复 电路设计 

分 类 号：TP301.6[自动化与计算机技术—计算机系统结构]