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作 者:Kang Hongbo Shen Yu
机构地区:[1]Institute of Electrical and Control Engineering , Chang'an University [2]College of Automation, Xi'an University of Posts Communications [3]School of Computer and Information Science, Southwest University
出 处:《The Journal of China Universities of Posts and Telecommunications》2016年第1期55-59,共5页中国邮电高校学报(英文版)
基 金:supported by Industrial Research Projects in department of education of Shaanxi province(2014K05-29);Science Research Projects in department of education of Shaanxi province(14JK1669,14JF028)
摘 要:In this paper, the influence of sampling intervals on the chattering in sliding mode (SM) control systems is considered. The describing function (DF) approach is employed to analyze the chattering characteristics in the sampling SM control. By the DF calculations and limit cycle existence conditions, an unstable limit cycle and two stable limit cycles are found in the SM control system. The frequencies and amplitudes of the two limit cycles can also be estimated by graphical calculations. The estimation accuracy of chattering parameters is evaluated by the simulations. The results of simulations show that the system could converge to a large and a small limit cycle from different initial conditions.In this paper, the influence of sampling intervals on the chattering in sliding mode (SM) control systems is considered. The describing function (DF) approach is employed to analyze the chattering characteristics in the sampling SM control. By the DF calculations and limit cycle existence conditions, an unstable limit cycle and two stable limit cycles are found in the SM control system. The frequencies and amplitudes of the two limit cycles can also be estimated by graphical calculations. The estimation accuracy of chattering parameters is evaluated by the simulations. The results of simulations show that the system could converge to a large and a small limit cycle from different initial conditions.
关 键 词:sampling interval chattering parameters describing function approach multiple limit cycle analysis
分 类 号:TP273[自动化与计算机技术—检测技术与自动化装置]
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