高g冲击载荷下多层陶瓷电容结构失效分析  

Failure analysis on multi-layer ceramic capacitor with high g value impact

作　　者：张旭辉[1] 虞跨海[1] 徐红玉[1] 梁斌[1] 康兴国[2] 

机构地区：[1]河南科技大学工程力学系,河南洛阳471023 [2]西安机电信息研究所,陕西西安710065

出　　处：《电子元件与材料》2016年第6期28-31,共4页Electronic Components And Materials

基　　金：国家自然科学基金资助项目(No.51105132);装备预研基金资助项目(No.9140A0506312BQ4201);河南科技大学研究生创新基金项目(No.CXJJ-ZR11)

摘　　要：基于弹性力学和有限元方法对冲击载荷作用下多层陶瓷电容力学响应开展了理论和数值仿真计算。结果表明:由于自身结构特点,冲击载荷下电容易出现应力集中,基板变形对电容失效影响较大,分析了各工况下电容内部易失效位置及失效机理,其主要破坏特征为焊锡开裂造成脱焊。Based on the elastic mechanics and finite element method, the mechanical response of the multilayerceramic capacitor under impact loading was carried out. The results show that： the capacitance is prone to stressconcentration under impact loading due to the capacitor’s structural characteristics. The substrate deformation has a greatinfluence on the failure of capacitor. The position and failure mechanism of the capacity failure are studied under variousoperating conditions. The major damage characteristics is solder cracking, causing desoldering.

关 键 词：多层陶瓷电容 弹性力学 有限元 失效分析 失效机理 应力集中 

分 类 号：TM53[电气工程—电器] TM28[一般工业技术—材料科学与工程]