红外焦平面阵列变积分时间下的非均匀性校正  

Nonuniformity correction of IRFPA with variable integration time

作　　者：张守荣[1] 王华[1] 张旭[1] 

机构地区：[1]北京空间机电研究所,北京100094

出　　处：《激光与红外》2016年第5期570-574,共5页Laser & Infrared

摘　　要：凝视红外焦平面成像系统中经常需要根据目标红外辐射强度来调节探测器积分时间,当积分时间变化后,红外图像的均匀性明显变差,本文探索了一种校正系数随着积分时间线性变化的焦平面非均匀性校正方法,克服了需要存储较多校正系数的问题,不仅使红外图像的均匀性得到较大幅度提高,而且在修改积分时间的情况下图像均匀性不受影响。According to the object＇s IR radiation intensity,the integration time of the detector is usually adjusted in staring infrared focal plane array（ IRFPA） imaging system.Uniformity of IR image is severely degraded when integration time varies.A new FPA nonuniformity correction method is proposed,and its correction coefficient linearly changes with integration time.This method overcomes the problem that many correction coefficients must be stored.This method can greatly improve uniformity of IR image and has no effect on uniformity of IR image when integration time changes.

关 键 词：成像系统 非均匀性校正 积分时间 红外焦平面阵列 

分 类 号：TN215[电子电信—物理电子学]