比较教学法应用于原子力显微镜仪器教学的探索  

Exploration of Comparison Method in Application to Atomic Force Microscope Instrument Teaching

作　　者：祝向荣[1] 许中平[1] 黎阳[1] 朱志刚[1] 于伟[1] 谢华清[1] 

机构地区：[1]上海第二工业大学环境与材料工程学院,上海201209

出　　处：《上海第二工业大学学报》2016年第2期164-168,共5页Journal of Shanghai Polytechnic University

基　　金：上海市教委本科重点教学改革项目;上海第二工业大学重点学科项目(No.XXKZD1601)资助

摘　　要：原子力显微镜(Atomic Force Microscope,AFM)作为一种广泛使用的材料纳米尺度微结构表征仪器,已列入许多理工科大学材料相关专业的仪器教学课程。利用比较教学法在AFM仪器教学中的应用进行了探索和实践。以材料科学研究热点对象石墨烯的微结构表征为例,在教学过程中,比较了氧化石墨烯和大片多层石墨烯的AFM形貌特征,氧化石墨烯和多层石墨烯的AFM成像和扫描电子显微镜(Scanning Electronic Microscope,SEM)成像特征,以及不同实验条件下氧化石墨烯的AFM成像形貌。通过这些比较教学内容,使学生对AFM仪器的工作原理和功能有了更深入的理解和掌握,AFM仪器的操作技能也得到了提升,并且对石墨烯材料的微结构特征有了更直观的了解。As one kind of widely used instruments for characterizing nanoscale structures of materials, atomic force microscope （AFM）has been listed as the practice course of material major by many technique universities. In this paper, comparison method is exploredand practiced in AFM course teaching. Graphene, one research focus in modern materials field, is used as the comparison teachingobject. Three types of comparisons are made. The first is the comparison of the AFM morphologies between the oxide graphene andthe large sheet of graphene. The second is the comparison of the AFM morphology and scanning electronic microscope （SEM） morphologyof the grapheme samples. The third is the comparison of the AFM morphologies of oxide graphene obtained under differentexperiment conditions. By conducting these comparisons, the students would well understand the principle and function of AFM. TheirAFM operating skills could also be enhanced. Additionally, they could obtain more intuitionistic knowledge about the micro-structurecharacteristics of graphene.

关 键 词：原子力显微镜 比较法 教学 石墨烯 

分 类 号：TB302-4[一般工业技术—材料科学与工程] G642[文化科学—高等教育学]