ICP-AES微波消解法测定中低碳铬铁中硅  

Determine Silicon in Medium and Low Carbon Ferrochromium with Microwave Digestion Method of Inductively Coupled Plasma Atomic Emission Spectrometry

作　　者：段晓晨[1] 王宴秋[1] 常欢[1] 陈英[1] 

机构地区：[1]内蒙古包钢钢联股份有限公司技术中心,内蒙古包头014010

出　　处：《包钢科技》2016年第3期64-67,共4页Science & Technology of Baotou Steel

摘　　要：研究了微波消解溶样,利用电感耦合等离子体光谱法测定铬铁中硅的方法。确定了微波消解和等离子体光谱仪的最佳的工作条件参数,选择出合适的溶样方法;考察了基体元素铬、铁、锰、磷对测定的影响。实验结果表明:该方法测定硅的检出限为0.010%,回收率在95%以上,相对标准偏差小于1%,具有很好的准确度和精密度,可以满足日常分析中对铬铁中硅含量的测定需要。In the paper,the microwave samples digestion and the method for determining silicon in ferrochromium with inductively coupled plasma atomic emission spectrometry are studied as well as their optimum working condition parameters and solution sample method are determined. Moreover,the effects of such matrix elements as chromium,iron,manganese and phosphorus on the determination are investigated. The experimental results show that the detection limit of silicon is0. 010%,recovery is over 95% and the relative standard deviation is less than 1% with this method,which are with good accuracy and precision to meet the needs of determining content of silicon in ferrochromium in routine analysis.

关 键 词：ICP-AES 铬铁 微波消解 

分 类 号：O657.31[理学—分析化学]