基于LABVIEW的温差半导体特性测量装置的研制  

The Development of Measuring Equipment Based on LABVIEW for Thermo-Semiconductor's Character

作　　者：任学智[1] 徐胜男[1] 李琪[1] 薛家豪 陈文娟[1] 展凯云[1] 

机构地区：[1]中国石油大学(华东),山东青岛266580

出　　处：《大学物理实验》2016年第3期87-91,共5页Physical Experiment of College

基　　金：中国石油大学(华东)教改项目(QN201531);中国石油大学(华东)精品实验项目(JS 201415);中国石油大学(华东)大学生创新创业训练项目(201510425063)

摘　　要：温差半导体作为一种新型的发电和制冷材料已经为人们所熟知,现有的温差半导体实验教学只能对半导体的特性进行简单的演示,无法进行定量的分析和计算,该装置基于LABVIEW通过第三方采集卡、温度传感器、电表以及温度控制器采集温差半导体制冷与发电的数据并进行分析处理,得出温差半导体的特性曲线和参数。该测量装置操作方便,可对温差半导体特性进行定量的分析和计算,有利于实验教学的改进。As a new type of power generation and refrigeration material,thermo-semiconductor has been known by the world.Existing experiment teaching of thermo-semiconductor can only accomplish simple demonstration of thermo-semiconductor’ s character without quantitative analysis and calculation. The facility based on LAB-VIEW can collect data of thermo-semiconductor’ s character and process it via the third party collection card, temperature sensor,voltmeter,amperemeter and temperature controller to get the characteristic curve and pa-rameter.The facility is easy to operate and it can analyze and calculate the data of thermo-semiconductor’ s character quantitatively.It benefit the improvement of experiment teaching.

关 键 词：温差半导体 LABVIEW 测量 

分 类 号：O4-33[理学—物理]