面向曲面品质分析的高光曲率线法  

Highlight Curvature Line Algorithm for Surface Interrogation

作　　者：薛杰 纪小刚[1,2] 朱仕魁 刘大鹏 何雪明[1,2] 

机构地区：[1]江南大学机械工程学院,江苏无锡214122 [2]江南大学江苏省食品先进制造装备技术重点实验室,江苏无锡214122

出　　处：《机械设计与研究》2016年第3期6-9,共4页Machine Design And Research

基　　金：国家自然科学青年基金资助项目(51105175);江苏省研究生科研创新工程资助项目(KYLX_1114);国家自然科学基金资助项目(51275210)

摘　　要：高光线法在曲面品质分析领域广泛应用。针对高光线法信息单调的缺陷,首先探讨了三角网格曲面上高光线的生成原理,优化了曲面特征点法矢量算法,给出了更为高效的高光点追踪算法,引入NURBS插值曲线反算法用于计算高光线。由此提出了一种曲面品质分析新方法一高光曲率线法。最后通过高光曲率线法的分析实例,验证文中所提出新算法在曲面品质分析上的优越性。Highlight line algorithm is widely applied in surface interrogation. As the lack of information provided by the present highlight line algorithm, this paper introduced the generation of highlight lines on triangular mesh surface in detaii. The normal vector algorithm was optimized on the feature points of surface. The new tracing algorithm given here was more efficient in tracing highlight points, and the highlight lines were figured out by reverse algorithm of NURBS interpolation curves on the base of existing highlight points. Then a new method, highlight curvature line algorithm, was put forward for surface interrogation. At last, the advantages of these new algorithms were verified by several analysis cases of surface interrogation.

关 键 词：曲面品质分析 高光线 高光曲率线 三角网格曲面 

分 类 号：TP391.72[自动化与计算机技术—计算机应用技术]