碳氟表面活性剂及其复配体系临界胶团浓度的测定  

Determination of the critical micellar concentration of amphoteric fluorocarbon surfactant and its mixed system

作　　者：王泽世[1] 侯迎迎[1] 刘金彦[1] 

机构地区：[1]内蒙古科技大学化学化工学院,内蒙古包头014010

出　　处：《内蒙古科技大学学报》2016年第2期185-189,共5页Journal of Inner Mongolia University of Science and Technology

基　　金：国家自然科学基金(No.21463016)

摘　　要：对于两性碳氟表面活性剂C8F17及其与阳离子表面活性剂CTAB、阴离子表面活性剂SDBS复配体系,分别以Ce3+和芘为探针,使用荧光光谱法研究体系临界胶团浓度(cmc),并且与表面张力法相比较来探究此方法的可行性.结果表明,Ce3+探针可以进行碳氟表面活性剂C8F17及其复配体系的临界胶束浓度的测定,芘探针的荧光光谱法只能进行C8F17复配体系的临界胶束浓度的测定,三种测定方法测定的结果一致,表明Ce3+是可以作为研究表面活性剂性质的荧光探针.The critical micellar concentrations （cmc） of both amphoteric fluorocarbon surtactant C8F17 and its mixtures with cation sur- factant of CTAB and anionic surfactant of SDBS were determined by adopting fluorescence spectrum Ce3 ＋ and pyrene as probes. And the results were compared with that of the surface tension method. The study shows that the method of cerium probe can measure the cmc of both C8 F17 and the mixed system, while pyreue probe can only be used to determine the cmc of the mixed system. The cmc val- ues measured by three methods mentioned above were consistent. The conclusion can be drawn that Ce3＋ can be used as the fluorescent probe for the study of the surfactants properties.

关 键 词：碳氟表面活性剂 复配体系 Ce3+ 荧光探针 

分 类 号：TQ423[化学工程]