用X光射线衍射法定量分析碳化硅砖的矿物组成  

Quantitative Analysis of Mineralographic Composition of Silicon Carbide Brick with X-ray Diffraction Method

作　　者：李秀娟[1] 何家梅[1] 胡春娥[1] 王长刚[1] 

机构地区：[1]鞍钢集团耐火材料公司

出　　处：《鞍钢技术》2002年第4期65-68,共4页Angang Technology

摘　　要：X光射线衍射法是定性定量分析、检测耐火材料矿物组成中同质异象、多晶转变等准确简便的方法 ,而且它可以完成光学显微镜和图像分析仪等因晶粒太小或在灰度上难以区别等不能定量工作的一些问题。在这种情况下 ,用X光射线衍射法既不损坏物质原有的矿物结构 。X ray diffraction method is an accurate and simple one to qualitatively and quantitatively analyze and detect the heteromorphism and polycrystalline transition of the refractory mineral composition, and it's able to solve some problems which are disable to quantitatively analyze by the optical microscope and image analyzer because the grain is too fine or the gray is difficult to distinct. In this case, using the x ray diffraction method could rapidly analyze the content of the hetromorphism mineral without damaging the original structure of the mineral.

关 键 词：定量分析 碳化硅砖 矿物组成 X光射线衍射法 耐火材料 

分 类 号：TQ175.711[化学工程—硅酸盐工业]