TECNAI SPIRIT型透射电子显微镜常见故障及解决方案  

Common Malfunctions and Solutions of TECNAI SPIRIT Transmission Electron Microscope.

作　　者：李爽[1] 董超[1] 崔新明[1] 李艳茹[1] 

机构地区：[1]吉林大学病理生物学教育部重点实验室,吉林长春150021

出　　处：《现代科学仪器》2016年第3期115-118,共4页Modern Scientific Instruments

摘　　要：摘要吉林大学病理生物学教育部重点实验室在2014年安装了FEI公司生产的TECNAISPIPdT型透射电子显微镜。该电镜数字化程度高，观察效果好，在图像接收和分析处理系统上优势明显。本文总结了我们在使用过程中遇到的一些问题及解决方案，希望通过操作人员进行的日常故障排查和处理，有效减少仪器保养、维护、维修成本及维修等待时间，从而提高仪器利用率、发挥仪器的最大功效，更好地为广大教师和科研工作者服务。Key Laboratory of Pathobiology, Ministry of Education of Jilin University installed the TECNAI SPIRIT transmission electron microscope （TEM） manufactured by the FEI company in 2014. The TEM is provided with high level of digital and satisfactory observing effect. There is advantage on the image receiving and processing. In this paper, some common malfunctions and solutions will be introduced, which can effectively reduce the costs of protection and maintenance, reduce the time for waiting repairs. We hope to provide better service for teachers and researchers by improving equipment utilization and making the instrument work best.

关 键 词：透射电镜 故障 方案 

分 类 号：TN16[电子电信—物理电子学]