某系统级电子装备随机振动试验方案优化技术  

Optimization Technology for Random Vibration Test Scheme of System-level Electronic Equipment

作　　者：杨静[1] 彭超[1] 王晓红[1] 

机构地区：[1]中国电子科技集团公司第三十八研究所,安徽合肥230088

出　　处：《电子机械工程》2016年第3期5-7,共3页Electro-Mechanical Engineering

摘　　要：随机振动试验是考察电子装备结构可靠性的关键项目。系统级电子装备集成化程度高,结构复杂,若采用传统方法制定其随机振动试验方案,则周期长且成本高。文中以某星载系统级天线模块为分析对象,提出了一种基于动态响应分析的系统级电子装备随机振动试验方案优化技术。通过建立合理的有限元模型并进行振动响应计算,能够快速获得天线模块结构各部分的振动响应,从而指导试验条件优化和响应点布置。该分析结果也可为系统级电子装备结构刚强度设计提供理论支撑。The random vibration test is the key to the structure reliability test of the electronic equipment. Because of high integration and complicated structure of the system-level electronic equipment,the traditional random vibration test works with long cycle and high cost. Based on dynamic response analysis,the random vibration test scheme optimization technology of the system-level electronic equipment is proposed for a spaceborne system-level antenna module. The structure vibration response of the antenna module can be obtained quickly by setting up a reasonable FEM model and carrying out vibration response computation. The results can provide guidance for the test conditions optimization and the response point arrangement and supply theoretical basis for the structure stiffness strength design of the system-level electronic equipment.

关 键 词：系统级电子装备 天线模块 随机振动试验 振动响应 有限元仿真 

分 类 号：TP391.9[自动化与计算机技术—计算机应用技术]