超长线列红外探测器组件拼接选片方法研究  

Chip selection method of super long linear infrared detector joint

作　　者：李冬冰[1] 郭亮[1] 王成刚[1] 杨微[1] 王亮[1] 宁玮[1] 

机构地区：[1]华北光电技术研究所,北京100015

出　　处：《激光与红外》2016年第7期827-831,共5页Laser & Infrared

摘　　要：为真实地反映探测器的性能参数,特别是非均匀性,针对红外焦平面长线列探测器的拼接选片,分析了像元倾角及立体角校正方法,分别给出了各自的数学模型,设计出拼接选片算法,适用于不同规格线列拼接探测器的拼接选片。In order to reflect the performance parameters of infrared detector really,especially the non- uniformity,a chip selection method of super linear infrared detector joint is proposed. Firstly,the correction methods of pixel tilt angle and solid angle are analyzed,and then their mathematic models are built respectively. The chip selection method of the joint is obtained. The results show this method is suitable for the chip selection methods for different linear infrared detector joints.

关 键 词：辐射通量 校正 非均匀性 立体角 冷屏 

分 类 号：TN214[电子电信—物理电子学]