X射线荧光光谱法测定废旧电子元器件中的金  

Determination of gold in recycled electronic components via X-ray fluorescence spectrometry

作　　者：史有俊[1] 付永立[1] 赵丙辉[1] 刘博雅[1] 赵烨[1] 

机构地区：[1]河北省地矿中心实验室

出　　处：《黄金》2016年第7期84-87,共4页Gold

摘　　要：将一定量废旧电子元器件溶解后的含金溶液加入到人工配制的基体中,制成X射线荧光分析样片,使其基体组成相近,消除了基体效应,提高了分析的精密度和准确度。与化学分析方法(氢醌容量法)测定结果相比,该方法具有简单快速、准确度高、测定成本低等特点,可替代化学分析方法。he disk specimens for X-ray fluorescence analysis are prepared by adding gold-bearing solutions ob-tained from the dissolution of certain amounts of recycled electronic components to an artificial matrix.With similar composition in the matrix of the analysis sample,the matrix effect is basically eliminated,which improves the precision and accuracy of the analysis.Compared with chemical analysis method, the method is simpler, faster, more accurate and has lower cost,and hence can replace chemical analysis.

关 键 词：X射线荧光光谱法 基体 废旧电子元件 分析测定 金 

分 类 号：O657.31[理学—分析化学]