一种提高错误定位效率的测试用例选择方法  

A Test Suite Selection Approach to Improving the Effectiveness of Fault Localization

作　　者：付文豪[1] 虞慧群[1] 范贵生[1] 

机构地区：[1]华东理工大学计算机科学与工程系

出　　处：《华东理工大学学报（自然科学版）》2016年第4期557-562,共6页Journal of East China University of Science and Technology

摘　　要：为提高错误定位的效率,提出了多种测试用例约简与选择的方法,然而,过度的约简与不适的选择造成了部分测试信息丢失,引起了错误定位有效性的损失。本文提出了一种相似测试用例选择方法,用以约简测试集。该方法能消除偶然测试用例对错误定位准确性造成的偏差,通过为每个失败测试用例选择执行轨迹与其相似的成功测试用例的方式,最大限度地保留测试的全部信息;基于选择出的测试用例信息,利用已有的错误定位方法输出程序语句的可疑值列表。以Siemens程序集作为实验对象,证明了本文测试用例选择方法能显著提高错误定位的有效性。In order to improve the effectiveness of fault localization,various test suite reduction and selection methods have been proposed in recent years.However,excessive reduction or improper selection on test cases may result in the loss of some testing information and affect the fault localization.In this paper,a new test suite selection approach is proposed to improve spectrum-based fault localization（SFL）.The proposed approach can eliminate the deviation in the accuracy of fault localization caused by coincidental passed test cases.By selecting similar test cases for each failed test case from the past test set,testing information is retained as more as possible.Besides,a ranking list is constructed by using an SFL technique with the new spectra.Finally,it is shown via experimental results on Siemens programs that the proposed approach can improve fault-localization effectiveness significantly.

关 键 词：调试 错误定位 测试用例选择 相似测试用例 

分 类 号：TP312[自动化与计算机技术—计算机软件与理论]