铜铅重金属胁迫下玉米光谱分形维数与污染监测研究  

Study on the Fractal Dimensionand Pollution Monitoring of Corn Spectra Stressed by Heavy Metal Cu and Pb

作　　者：杨可明[1] 卓伟[1] 张婉婉[1] 汪国平[1] 刘二雄 

机构地区：[1]中国矿业大学(北京)地球科学与测绘工程学院,北京100083

出　　处：《科学技术与工程》2016年第24期228-234,共7页Science Technology and Engineering

基　　金：国家自然科学基金(41271436);中央高校基本科研业务费专项资金(2009QD02)资助

摘　　要：通过设定不同浓度梯度的重金属Cu、Pb胁迫下的玉米盆栽试验,利用美国高性能地物光谱仪SVC HR-1024I对不同浓度铜铅污染的玉米老、中、新叶片进行光谱测量,同时采用SPAD-502叶绿素含量测定仪测定各类叶片中叶绿素含量相对值,并通过化学方法测定不同胁迫程度下玉米叶片中的铜铅含量。在分析玉米叶片中Cu、Pb含量与光谱曲线的绿峰高度（GH）、红谷深度（RD）、蓝边（DB）、红边最大值（MR）、红边面积（FAR）、红边一阶微分曲线陡峭度（FCDR）之间相关性的基础上,利用分形理论对叶片410~780 nm之间的光谱曲线进行分形测量,提出运用光谱曲线分形维数（FRAC）对受不同浓度重金属铜铅污染的玉米叶片进行污染监测,同时对相同浓度铜铅胁迫下的老、中、新叶片也进行了光谱响应研究。结果表明,随着叶片中重金属含量增加光谱曲线分形维数也逐渐增大,同等浓度重金属铜铅胁迫程度下,分形维数从新叶到老叶逐渐减小,并且发现光谱曲线分形维数与绿峰高度、红谷深度、红边面积具有较好的相关性,说明光谱曲线分形维数不仅可以综合描述曲线的光谱特性,还能定量反映玉米叶片受重金属铜铅污染程度及其健康状况。因此,光谱曲线分形维数可以作为玉米叶片重金属污染监测的一种新方法。By setting the corn potted plant experiment stressed by different concentrations of Cu and Pb,the spectral reflectance of potted old,middle and new corn leaves stressed by different concentrations of Cu and Pb were measured by the spectrometer of SVC HR-1024 I,and the corn leaves’ chlorophyll content were measured by Chlorophyll meter SPAD-502 at the same time. The content of corn leaves’ Cu and Pb were measured by chemical methods. The spectral curve fractal dimension（ FRAC） was put forward to monitor corn leaves polluted buy different concentrations of Cu and Pb based on the Correlation analysis between height of green peek（ GH）,absorption depth of red（ RD）,blue edge（ DB）,maximum-value of red-edge（ MR）,first-derivative area of red-edge（ FAR） first-derivative curve steep degree of red-edge（ FCDR） and different content of Cu and Pb. Then using fractal dimension（ FRAC） research the old,middle and new corn leaves’ spectral response under the same concentrations of Cu and Pb. The results shows that the fractal dimension increased with the increasing of content of Cu and Pb in the corn leaves,and fractal dimension reduced when the corn leaves from new to old at the same degree stressed by Cu and Pb. Fractal dimension with height of green peek,absorption depth of red and first-derivative area of red-edge have a good correlation as well. Indicting that spectral curve fractal dimension can not only describe the spectral characteristics of the curve but also distinguish the stress degree of Cu and Pb in quantity and different health condition of corn leaves. So,spectral curve fractal dimension can be used as a new method to monitor heavy metal pollution of corn leaves.

关 键 词：盆栽玉米 重金属胁迫 分形维数 光谱特性 污染监测 

分 类 号：TP75[自动化与计算机技术—检测技术与自动化装置]