云纹干涉法测定1200℃单晶材料弹性模量及泊松比研究  

Moire Interferometer Method for Measuring Young's Modulus and Poisson Ratio of 1 200℃ High-temperature

作　　者：张宸宇[1] 吴琼[1] 董爱民[1] 

机构地区：[1]南昌航空大学飞行器工程学院,江西南昌330063

出　　处：《应用激光》2016年第4期434-439,共6页Applied Laser

摘　　要：通常金属试件表面零厚度光栅在800~1 000℃下就发生氧化和低固溶点金属的溢出,导致试件表面的光栅被完全覆盖,无法继续测量。本文通过特殊的物理方法处理,使试件表面光栅重新显现,从而获得1 200℃下清晰的干涉条纹,成功测试该温度下单晶材料的弹性模量和泊松比。The zero-thickness grating of the metal specimen surface will be oxidized and overflowed by lowing melting point metals from 800 to 1000℃. The grating will be completely covered and cannot continues to be measured, A new special physical approach was proposed to reappear the grating, then the clear interference stripes were abtained at 1200℃. Young＇s modu lus and Poisson＇s ratio of the high temperature alloys at 1 200℃could be tesed.

关 键 词：云纹干涉 1 200℃ 弹性模量 泊松比 

分 类 号：O348.1[理学—固体力学]